Lead Open Detection Based on Supply Current of CMOS LSIs

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Abstract

In this paper, a test method is proposed to detect lead opens in CMOS LSIs. The test method is based on supply current which flows when test input vectors and AC electric field are provided from the outside of the ICs. Also, an application method of the test input vectors is proposed in this paper. It is shown experimentally that lead opens of SSIs and LSIs will be detected by providing each of the test input vectors per the period of AC electric field applied.

Journal

  • IEICE Trans. Fundamentals, A

    IEICE Trans. Fundamentals, A 87 (6), 1330-1337, 2004-06-01

    The Institute of Electronics, Information and Communication Engineers

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Keywords

Details 詳細情報について

  • CRID
    1572261552371298560
  • NII Article ID
    110003213039
  • NII Book ID
    AA10826239
  • ISSN
    09168508
  • Text Lang
    en
  • Data Source
    • CiNii Articles

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