D-10-2 A Method of Generating Test Patterns for Dynamic Open Faults
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- Takahashi Hiroshi
- Ehime Univ.
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- Higami Yoshinobu
- Ehime Univ.
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- Watanabe Tetsuya
- Ehime Univ.
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- Aikyo Takashi
- Ehime Univ.
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- Takamatsu Yuzo
- Ehime Univ.
Bibliographic Information
- Other Title
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- D-10-2 動的なオープン故障に対するテストパターン生成法(D-10. ディペンダブルコンピューティング,一般セッション)
Search this article
Journal
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- Proceedings of the IEICE General Conference
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Proceedings of the IEICE General Conference 2008 (1), 161-, 2008-03-05
The Institute of Electronics, Information and Communication Engineers
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Details 詳細情報について
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- CRID
- 1572543027184091392
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- NII Article ID
- 110006868154
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- NII Book ID
- AN10471452
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- Text Lang
- ja
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- Data Source
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- CiNii Articles
