Extra Wideband Polarimetry, Interferometry and Polarimetric Interferometry in Synthetic Aperture Remote Sensing

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The development of Radar Polarimetry and Radar Interferometry is advancing rapidly. Whereas with radar polarimetry, the textural fine-structure, target orientation, symmetries and material constituents can be recovered with considerable improvement above that of standard amplitude-only radar; with radar interferometry the spatial(in depth)structure can be explored. In Polarimetric Interferometric Synthetic Aperture Radar(POL-IN-SAR)Imaging, it is possible to recover such co-registered textural and spatial information from POL-IN-SAR digital image data sets simultaneously, including the extraction of Digital Elevation Maps(DEM) from either Polarimetric(scattering matrix)or Interferometric(single platform: dual antenna)SAR systems. Simultaneous Polarimetric-plus-Interferometric SAR offers the additional benefit of obtaining co-registered textural-plus-spatial three-dimensional POL-IN-DEM information, which when applied to Repeat-Pass Image-Overlay Interferometry provides differential background validation, stress assessment and environmental stress-change information with high accuracy. Then, by either designing Multiple Dual-Polarization Antenna POL-IN-SAR systems or by applying advanced POL-IN-SAR image compression techniques, it will result in POL-arimetric TOMO-graphic(Multi-Inter-ferometric)SAR or POL-TOMO-SAR Imaging. This is of direct relevance to local-to-global environmental background validation, stress assessment and stress-change monitoring of the terrestrial and planetary covers.

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