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Vacuum Breakdown Strength of Vacuum-degassed Oxygen-free Copper Electrodes
Bibliographic Information
- Other Title
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- Vacuum breakdown strength of vacuum‐degassed oxygen‐free copper electrodes
Journal
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- IEEE Trans.Electrical Insulation
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IEEE Trans.Electrical Insulation 25 (4), 1991
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Details 詳細情報について
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- CRID
- 1573105974207888128
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- NII Article ID
- 10005320811
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- Data Source
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- CiNii Articles
- Crossref