Fringe analysis for wavelength-scanning interferometers using phase-shifting method and its application to profilometry

Bibliographic Information

Other Title
  • 位相シフト法による波長走査干渉縞の処理とその形状測定への応用

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Details 詳細情報について

  • CRID
    1573105975008451072
  • NII Article ID
    10015810201
  • NII Book ID
    AN10547747
  • Text Lang
    ja
  • Data Source
    • CiNii Articles

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