- 【Updated on May 12, 2025】 Integration of CiNii Dissertations and CiNii Books into CiNii Research
- Trial version of CiNii Research Automatic Translation feature is available on CiNii Labs
- Suspension and deletion of data provided by Nikkei BP
- Regarding the recording of “Research Data” and “Evidence Data”
Gate-Length Dependence of DC Characteristics in Submicron-Gate AlGaN/GaN HEMTs
-
- IDE Toshihide
- Advanced Industrial Science and Technology (AIST), Power Electronics Research Center
-
- SHIMIZU Mitsuaki
- Advanced Industrial Science and Technology (AIST), Power Electronics Research Center
-
- YAGI Shuichi
- Advanced Industrial Science and Technology (AIST), Power Electronics Research Center
-
- INADA Masaki
- Advanced Industrial Science and Technology (AIST), Power Electronics Research Center
-
- PIAO Guanxi
- Advanced Industrial Science and Technology (AIST), Power Electronics Research Center
-
- YANO Yoshiki
- Tsukuba Laboratory, TAIYO NIPPON SANSO Corporation
-
- AKUTSU Nakao
- Tsukuba Laboratory, TAIYO NIPPON SANSO Corporation
-
- OKUMURA Hajime
- Tsukuba Laboratory, TAIYO NIPPON SANSO Corporation
-
- ARAI Kazuo
- Tsukuba Laboratory, TAIYO NIPPON SANSO Corporation
Search this article
Journal
-
- Extended abstracts of the ... Conference on Solid State Devices and Materials
-
Extended abstracts of the ... Conference on Solid State Devices and Materials 2006 632-633, 2006-09-13
- Tweet
Details 詳細情報について
-
- CRID
- 1573105975462335488
-
- NII Article ID
- 10022546273
-
- NII Book ID
- AA10777858
-
- Text Lang
- en
-
- Data Source
-
- CiNii Articles
