Eddy current testing of anomalies in conductive materials, Part I : Quantitative imaging via diffraction tomography techniques

DOI 2 Citations

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Details 詳細情報について

  • CRID
    1573105975999185536
  • NII Article ID
    30019698067
  • DOI
    10.1109/20.141295
  • Data Source
    • CiNii Articles

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