Impact of Body Bias Controlling in Partially Depleted SOI Devices with Hybrid Trench Isolation Technology
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- IWAMATSU Toshiaki
- Advanced Device Development Dept., Renesas Technology Corp.
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- TSUJIUCHI Mikio
- Advanced Device Development Dept., Renesas Technology Corp.
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- HIRANO Yuuichi
- Advanced Device Development Dept., Renesas Technology Corp.
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- IKEDA Tatsuhiko
- Advanced Device Development Dept., Renesas Technology Corp.
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- KOMATSU Futoshi
- Renesas Semiconductor Engineering Corp.
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- IPPOSHI Takashi
- Advanced Device Development Dept., Renesas Technology Corp.
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- MAEGAWA Shigeto
- Advanced Device Development Dept., Renesas Technology Corp.
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- OHJI Yuzuru
- Advanced Device Development Dept., Renesas Technology Corp.
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- Extended abstracts of the ... Conference on Solid State Devices and Materials
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Extended abstracts of the ... Conference on Solid State Devices and Materials 2005 886-887, 2005-09-13
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- CRID
- 1573387450438734720
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- NII論文ID
- 10022543548
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- NII書誌ID
- AA10777858
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- 本文言語コード
- en
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- データソース種別
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