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Adaptive Low Shift Power Test Pattern Generator for Logic BIST
Journal
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- ATS Proceedings of the 2010 19th IEEE Asian Test Symposium
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ATS Proceedings of the 2010 19th IEEE Asian Test Symposium 2010
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Details 詳細情報について
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- CRID
- 1573387450972649600
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- NII Article ID
- 10031114021
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- Data Source
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- CiNii Articles
