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Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices : JESD89A
Journal
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- JEDEC STANDARD, JEDEC Sold State Technology Association
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JEDEC STANDARD, JEDEC Sold State Technology Association 89 1-85, 2006
- Tweet
Details 詳細情報について
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- CRID
- 1573387451030425344
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- NII Article ID
- 10027931832
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- Data Source
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- CiNii Articles
