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Reliability growth during a development testing program
Journal
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- Technometrics
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Technometrics 8 53-60, 1966
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Details 詳細情報について
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- CRID
- 1573387451212558848
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- NII Article ID
- 30022451270
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- DOI
- 10.2307/1266261
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- Data Source
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- CiNii Articles
