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Development of Free-space Type Microwave Test Bench : Design concept of multi-U-type test bench and its example
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- SHIBUYA Shigekazu
- Shibuya, Consultant Office
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- ISHIZUKA Haruo
- Ishizuka, Consultant Office
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- KAMESHIMA Akinori
- Kameshima, Consultant Office
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- KINOSHITA Toshio
- EMCT Study Group
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- SUZUKI Takashi
- Net Alpha
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- OHNO Yutaka
- System Technico
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- SUZUKI Naoki
- Wooden Bell Consultant
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- KAKU Juiti
- Colory
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- UNNO Koujiro
- Colory
Bibliographic Information
- Other Title
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- 自由空間型マイクロ波テストベンチの開発 : マルチU型テストベンチの設計コンセプトと参考例
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Description
International organizations such as IEC. CISPR and CENELEC are working for early finalization of the EMI test methods in microwave frequency bands including UHF, SHF and EHF. Recently the CISPR Yokosuka conference held on November 1997 established agreements on such conditions to design the EMI site used over frequencies 1 Ghz or higher as; (1) open-area test site to be of free-space type, (2) test distance to be 3-m, (3) no restriction for the alternative test site type, (4) insuring far-field condition (for test distance ≦ 2a^2/ λ where [a] is antenna aperture size and λ is wavelength and (5) EUT to be positioned within the main lobe of antenna (within -ldB angle range). This study report shows attainment of the free space as the international requirement through a simple method using multiple U-fence to remove waves reflected over the ground plane. The microwave test bench means a working desk for measurement of the microwave ENI and ofgeneral research and engineering. And it is a small type, light weight and knockdown type test site that facilitates transportation as required. The far-field condition indicated by CISPR is desirous to be deleted because it may lead to a conflict with application of various design elements.
Journal
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- Technical report of IEICE. RCS
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Technical report of IEICE. RCS 98 (600), 1-8, 1999-02-17
The Institute of Electronics, Information and Communication Engineers
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Keywords
Details 詳細情報について
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- CRID
- 1573387452257976064
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- NII Article ID
- 110003305249
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- NII Book ID
- AN10060822
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- Text Lang
- ja
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- Data Source
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- CiNii Articles