Clustering by SOM (Self-Organizing Maps) and MST (Minimal Spanning Tree)

  • IWAMOTO Kazuyuki
    Department of Electrical and Electronic Engineering, Tottori University
  • OBU-CANN OKwaw
    Department of Electrical and Electronic Engineering, Tottori University
  • TOKUTAKA Heizo
    Department of Electrical and Electronic Engineering, Tottori University
  • FUJIMURA Kikuo
    Department of Electrical and Electronic Engineering, Tottori University

Bibliographic Information

Other Title
  • SOM(自己組織化マップ)とMST(最小結合木構造)によるクラスタ分類

Search this article

Description

Chemical spectra such as, AES (Auger Electron Spectroscopy), XPS (X-ray Photoelectron Spectroscopy), and XRD (X-Ray Diffraction) can be considered to be multi-dimensional information. They are mapped by using SOM and MST (Minimal Spanning Tree) methods. The units which are connected by MST are carefully observed among the compositions of 0-100% and all the OR combinations among the units selected. The classified results are compared with the clusters sorted by human eye in the SOM method.

Journal

References(1)*help

See more

Details 詳細情報について

  • CRID
    1573387452284314496
  • NII Article ID
    110003233509
  • NII Book ID
    AN10091178
  • Text Lang
    ja
  • Data Source
    • CiNii Articles

Report a problem

Back to top