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- SUZUKI Kazuyoshi
- Graduate School of Information Science and Engineering, Tokyo Institute of Technology
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- KASHIYAMA Toshihiko
- Graduate School of Information Science and Engineering, Tokyo Institute of Technology
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- FUJIWARA Eiji
- Graduate School of Information Science and Engineering, Tokyo Institute of Technology
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説明
Error control codes have extensively been applied to semiconductor memories using high density RAM chips with wide I/O data, e.g., with 8-bit or 16-bit I/O data. Recently, spotty byte errors called s-spotty byte errors are newly defined as t or fewer bits errors in a byte having length b bits, where 1≤t≤b. This paper proposes another type of spotty byte errors, i.e., m-spotty byte errors, where more than t bits errors in a byte may occur due to hit by high energetic particles. For these errors, this paper presents generalized m-spotty byte error control codes with minimum m-spotty distance d.
収録刊行物
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- IEICE transactions on fundamentals of electronics, communications and computer sciences
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IEICE transactions on fundamentals of electronics, communications and computer sciences 90 (7), 1418-1427, 2007-07-01
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詳細情報 詳細情報について
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- CRID
- 1573387452382166656
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- NII論文ID
- 110007538069
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- NII書誌ID
- AA10826239
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- ISSN
- 09168508
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles