A Triple Quantum Dot in a Single-Wall Carbon Nanotube
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- K. Grove-Rasmussen
- NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 243-0198, Japan, and Nano-Science Center, Niels Bohr Institute, University of Copenhagen, Universitetsparken 5, 2100 Copenhagen Ø, Denmark
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- H. I. Jørgensen
- NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 243-0198, Japan, and Nano-Science Center, Niels Bohr Institute, University of Copenhagen, Universitetsparken 5, 2100 Copenhagen Ø, Denmark
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- T. Hayashi
- NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 243-0198, Japan, and Nano-Science Center, Niels Bohr Institute, University of Copenhagen, Universitetsparken 5, 2100 Copenhagen Ø, Denmark
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- P. E. Lindelof
- NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 243-0198, Japan, and Nano-Science Center, Niels Bohr Institute, University of Copenhagen, Universitetsparken 5, 2100 Copenhagen Ø, Denmark
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- T. Fujisawa
- NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 243-0198, Japan, and Nano-Science Center, Niels Bohr Institute, University of Copenhagen, Universitetsparken 5, 2100 Copenhagen Ø, Denmark
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説明
A top-gated single wall carbon nanotube is used to define three coupled quantum dots in series between two electrodes. The additional electron number on each quantum dot is controlled by top-gate voltages allowing for current measurements of single, double and triple quantum dot stability diagrams. Simulations using a capacitor model including tunnel coupling between neighboring dots captures the observed behavior with good agreement. Furthermore, anti-crossings between indirectly coupled levels and higher order cotunneling are discussed.
Supporting Information is available at Nano Lett. website (see link below)
収録刊行物
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- Nano Letters
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Nano Letters 8 (4), 1055-1060, 2008-03-04
American Chemical Society (ACS)
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詳細情報 詳細情報について
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- CRID
- 1363951794600618112
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- NII論文ID
- 10022551964
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- NII書誌ID
- AA10777858
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- ISSN
- 15306992
- 15306984
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- PubMed
- 18314966
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