Functional failure analysis technology from backside of VLSI chip
Journal
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- Proc. of the 20th Int. Symp. For Testing and Failure Analysis, ASM Int., 1994
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Proc. of the 20th Int. Symp. For Testing and Failure Analysis, ASM Int., 1994 41-47, 1994
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Details 詳細情報について
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- CRID
- 1573668925480841344
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- NII Article ID
- 10024081361
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- Data Source
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- CiNii Articles