A Study for Fault Diagnosis in Sequential Circuits using Sensitizing Sequence Pairs
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- YANAGIDA Nobuhiro
- Department of Computer Science, Faculty of Engineering Ehime University
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- TAKAHASHI Hiroshi
- Department of Computer Science, Faculty of Engineering Ehime University
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- TAKAMATSU Yuzo
- Department of Computer Science, Faculty of Engineering Ehime University
Bibliographic Information
- Other Title
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- 活性化入力系列を用いた順序回路の故障診断に関する一考察
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Description
This paper presents a new approach to multiple fault diagnosis in sequential circuits by using input-sequence pairs having sensitizing input pairs. We call such the input-sequence pair the sensitizing sequence pair in this paper. First, we generate sensitizing sequence pairs from a test sequence detecting a single stack-at fault in a sequential circuit and use a set of sensitizing sequence pairs to diagnose multiple faults in the sequential circuit. Next, we describe a method for diagnosing multiple faults in sequential circuits partitioned into sub circuits. This represents an extension of our previous work dealing with combinational circuits. From a relation between a sensitizing path generated by a sensitizing sequence pair and a subcircuit, this method deduces the suspected faults for the subcircuits, one by one, based on the responses observed at primary outputs. Finally, we study the efficiency of the method from experimental results for benchmark circuits.
Journal
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- Technical report of IEICE. VLD
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Technical report of IEICE. VLD 95 (306), 17-24, 1995-10-19
The Institute of Electronics, Information and Communication Engineers
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Details 詳細情報について
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- CRID
- 1573668927130286976
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- NII Article ID
- 110003294723
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- NII Book ID
- AN10013323
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- Text Lang
- ja
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- Data Source
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- CiNii Articles
