Investigation of Inversion C-V Reconstruction for Long-Channel MOSFETs with Leaky Dielectrics using Intrinsic Input Resistance Approach
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- LEE Wei
- Department of Electronics Engineering, National Chiao Tung University
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- SU Pin
- Department of Electronics Engineering, National Chiao Tung University
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- SU Ke-Wei
- Taiwan Semiconductor Manufacturing Company
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- CHIANG Chung-Shi
- Taiwan Semiconductor Manufacturing Company
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- LIU Sally
- Taiwan Semiconductor Manufacturing Company
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- Extended abstracts of the ... Conference on Solid State Devices and Materials
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Extended abstracts of the ... Conference on Solid State Devices and Materials 2006 416-417, 2006-09-13
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詳細情報 詳細情報について
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- CRID
- 1573950400392520064
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- NII論文ID
- 10022545568
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- NII書誌ID
- AA10777858
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles