Sequential Redundancy Removal Using Test Generation and Multiple Strongly Unreachable States

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説明

A procedure to remove redundancies in sequential circuits is proposed using strongly unreachable states, which are the states with no incoming transitions. Test generation is used to find undetectable faults related to two or more strongly unreachable states. Experimental results show the new procedure can find more redundancies of sequential circuits.

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詳細情報 詳細情報について

  • CRID
    1573950402004399616
  • NII論文ID
    110006376593
  • NII書誌ID
    AA10826272
  • ISSN
    09168532
  • 本文言語コード
    en
  • データソース種別
    • CiNii Articles

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