Sequential Redundancy Removal Using Test Generation and Multiple Strongly Unreachable States
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- YOTSUYANAGI Hiroyuki
- Faculty of Engineering, University of Tokushima
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- HASHIZUME Masaki
- Faculty of Engineering, University of Tokushima
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- TAMESADA Takeomi
- Faculty of Engineering, University of Tokushima
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抄録
A procedure to remove redundancies in sequential circuits is proposed using strongly unreachable states, which are the states with no incoming transitions. Test generation is used to find undetectable faults related to two or more strongly unreachable states. Experimental results show the new procedure can find more redundancies of sequential circuits.
収録刊行物
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- IEICE transactions on information and systems
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IEICE transactions on information and systems 85 (10), 1605-1608, 2002-10-01
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詳細情報 詳細情報について
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- CRID
- 1573950402004399616
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- NII論文ID
- 110006376593
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- NII書誌ID
- AA10826272
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- ISSN
- 09168532
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles