Sequential Redundancy Removal Using Test Generation and Multiple Strongly Unreachable States
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- YOTSUYANAGI Hiroyuki
- Faculty of Engineering, University of Tokushima
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- HASHIZUME Masaki
- Faculty of Engineering, University of Tokushima
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- TAMESADA Takeomi
- Faculty of Engineering, University of Tokushima
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Abstract
A procedure to remove redundancies in sequential circuits is proposed using strongly unreachable states, which are the states with no incoming transitions. Test generation is used to find undetectable faults related to two or more strongly unreachable states. Experimental results show the new procedure can find more redundancies of sequential circuits.
Journal
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- IEICE transactions on information and systems
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IEICE transactions on information and systems 85 (10), 1605-1608, 2002-10-01
The Institute of Electronics, Information and Communication Engineers
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Keywords
Details 詳細情報について
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- CRID
- 1573950402004399616
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- NII Article ID
- 110006376593
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- NII Book ID
- AA10826272
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- ISSN
- 09168532
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- Text Lang
- en
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- Data Source
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- CiNii Articles
