Surface Potential Decay and Residual Voltage Measurements in Highly Elongated Polyethylene
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- Park Dae Hee
- Faculty of Engineering, Osaka University
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- Kyokane Jun
- Nara National College of Technology
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- Yoshino Katsumi
- Faculty of Engineering, Osaka University
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説明
The residual voltage which appears in a pre-stressed polyethylene film is found to increase with increasing draw ratio and then to decrease again at higher draw ratio. On the other hand, the ratio of a surface potential decay decreases with increasing draw ratio and then again increases at higher ratio. These results are discussed in terms of the change of the carrier transport process, localized state density and carrier mobility.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 26 (1), L65-L67, 1987
公益社団法人 応用物理学会
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詳細情報 詳細情報について
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- CRID
- 1573950402917966208
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- NII論文ID
- 130003401575
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- ISSN
- 00214922
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles