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A 45nm Low-Standby-Power Embedded SRAM with Improved Immunity Against Process and Temperature Variations
Journal
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- IEEE ISSCC Dig. Tech. Papers, Feb., 2007
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IEEE ISSCC Dig. Tech. Papers, Feb., 2007 326-327, 2007
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Details 詳細情報について
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- CRID
- 1574231875521413632
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- NII Article ID
- 10030051472
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- Data Source
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- CiNii Articles
