Overview of HVEM Investigations in Materials Science
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説明
High-voltage electron microscopy possesses a number of advantages that cannot be afforded by conventional electron microscopy. Topics in recent investigations with HVEMs in materials science are reviewed.
収録刊行物
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- Journal of Analytical Science and Technology
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Journal of Analytical Science and Technology 2 A1-A7, 2011-12-22
Springer Science and Business Media LLC
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キーワード
詳細情報 詳細情報について
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- CRID
- 1870020692956763904
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- ISSN
- 20933371
- 20933134
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- データソース種別
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- OpenAIRE