<title>Surface profiling of an absorber embedded in a dense medium by spatial integration of the backscattered light</title>
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説明
The new method to reconstruct the 2D surface profile of an absorber embedded in a dense scattering medium is proposed in the report. The method is based on the fact that the intensity of the multiply-backscattered light integrated spatially by the detecting aperture with finite size is directly related with the optical path-length distribution. Experiments and Monte Carlo simulations confirm the potential and the availability of the proposed method.
収録刊行物
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- SPIE Proceedings
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SPIE Proceedings 3749 727-728, 1999-07-19
SPIE