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説明
The tape thickness and width are reduced in order to realize high-density recording, long time recording and small mechanism (e.g., digital-VCR). Thus, the tape stiffness becomes very low and the tape tends to be damaged. We have developed a new methodology and a new analysis system to optimize the tape damage free loading mechanism design.
収録刊行物
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- IEEE Transactions on Consumer Electronics
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IEEE Transactions on Consumer Electronics 42 952-958, 1996-01-01
Institute of Electrical and Electronics Engineers (IEEE)