Characterization of EM faults on ATmega328p
説明
We investigate the effects of EM pulses on an ATmega328p 8-bit microcontroller. We establish which areas of the chip are sensitive to EM pulse injection and describe the fault model for these sensitive areas. Furthermore, we compare our results to those of a previous study, which examined the effects of laser fault injection on the same device.
収録刊行物
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- 2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC)
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2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC) 1-4, 2019-06-01
IEEE