Free-ion yields, electron mobilities, and electron-ion recombination coefficients in liquid tetramethylsilane
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説明
Abstract Electron mobilities and electron-ion recombination coefficients have been determined at 253 K and 170 K by analysing transient electric current through a liquid tetramethylsilane sample. In a conductivity cell ionization was induced by X-ray pulse irradiation under a dc external electric field lower than 10.5 kV/cm. Also results on free-ion yield and electron mobility are discussed. Their dependence on temperature and electric field are investigated.
収録刊行物
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- Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
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Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 327 15-17, 1993-03-01
Elsevier BV