この論文をさがす
説明
<jats:p>Interlayer exchange couplings were examined for Co2FeAl0.5Si0.5(CFAS)/Cr/CFAS trilayered films grown on MgO (001) single crystal and thermally oxidized Si substrates. The films were (001) epitaxial on MgO and (110) textured polycrystalline on SiO2. Strong exchange couplings were observed for the films with the 1.5 nm thick Cr spacer layer. A 90° coupling is dominant in the (001) epitaxial film. In contrast, an antiparallel coupling exists in the polycrystalline one. The relationship of interlayer couplings with the structure is discussed.</jats:p>
収録刊行物
-
- Journal of Applied Physics
-
Journal of Applied Physics 105 2009-03-03
AIP Publishing
- Tweet
キーワード
詳細情報 詳細情報について
-
- CRID
- 1870583642514552192
-
- ISSN
- 10897550
- 00218979
-
- データソース種別
-
- OpenAIRE