Work function measurement of Hf-oxide/W(100) surface by using of photoemission electron microscope
書誌事項
- タイトル別名
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- Work Function Measurement of Er-oxide/W(100) Surface by using of Photoemission Electron Microscope
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説明
A cathode material of a low work function is needed to achieve a high performance electron source. We measured the work function of W(100) surface modified with Er2O3 by using of photoemission electron microscope. The work function of Er-oxide/W(100) surface is measured to be 2.65eV.
収録刊行物
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- 2015 28th International Vacuum Nanoelectronics Conference (IVNC)
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2015 28th International Vacuum Nanoelectronics Conference (IVNC) 110-111, 2015
IEEE
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詳細情報 詳細情報について
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- CRID
- 1050001201688564864
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- NII論文ID
- 120006671918
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- HANDLE
- 10258/00009008
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- ISSN
- 21642370
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- 本文言語コード
- en
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- 資料種別
- conference paper
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- データソース種別
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