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Measurement and analysis of delay variation due to inductive coupling
Description
Inductive coupling is becoming a design concern for global interconnects in advanced technologies. This paper discusses interconnect delay variation due to inductive coupling. We first examine the difference in delay change curve with respect to relative transition timings of aggressors and victim between with and without considering inductive coupling by simulation. We verify that the difference in delay change curve due to inductive coupling is also observed in measurement of test chips
Journal
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- Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005.
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Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005. 298-301, 2006-01-18
IEEE