<title>Fast birefringence measurement using right and left hand circulary polarized laser</title>
この論文をさがす
説明
A fast and accurate birefringence measurement system has been built to study the in-plane birefringence of a rotating optical disk substrate. The fully automated instrument incorporates an axial Zeeman laser which emits both right and left hand circularly polarized lights, stationary polarization elements and a lock-in amplifier. Measurement results showing the accurate and fast features on the system are presented. It is also demonstrated that the in-plane birefringence mapping in rotating substrate of optical disk can be obtained by use of the ability of fast birefringence measurement.© (1996) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
収録刊行物
-
- SPIE Proceedings
-
SPIE Proceedings 2873 119-122, 1996-08-16
SPIE
