Large dielectric constant arising from space‐charge polarization in a SrTiO<sub>3</sub> thin film grown on an YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7–<i>δ</i></sub> layer
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<jats:title>Abstract</jats:title><jats:p>The frequency and temperature dependence of the dielectric constant of SrTiO<jats:sub>3</jats:sub> (STO) thin‐film capacitors in multilayer structures of YBa<jats:sub>2</jats:sub>Cu<jats:sub>3</jats:sub>O<jats:sub>7–<jats:italic>δ</jats:italic></jats:sub>/SrTiO<jats:sub>3</jats:sub>/YBa<jats:sub>2</jats:sub>Cu<jats:sub>3</jats:sub>O<jats:sub>7–<jats:italic>δ</jats:italic></jats:sub> films were measured over the frequency range 100 to 10<jats:sup>6</jats:sup> Hz at 2–300 K. In a 750‐nm‐thick STO film, a low‐frequency dielectric dispersion gradually occurs in the temperature region below 50 K; at 5 K, the dielectric constant <jats:italic>ε</jats:italic><jats:sub>r</jats:sub> increases to 1.1 × 10<jats:sup>5</jats:sup> at frequencies below 10<jats:sup>3</jats:sup> Hz. A space‐charge polarization mechanism is responsible for the large observed dielectric constant of the STO thin films at low temperatures. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)</jats:p>
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- physica status solidi (a)
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physica status solidi (a) 202 2005-10-17
Wiley