Range finding with simultaneous projection of modulated patterns
説明
Range image measurement using structured light has been widely utilized. A new structured light employing modulated patterns is proposed. By projecting the pattern light and signal processing in time domain, it is possible to obtain the 3D geometric information of objects more accurately. By using a matched filter to extract the structured light in an image, it is possible to project multiple structured light from several positions simultaneously for reducing occlusion problem. This paper describes the new method with some experiments.
収録刊行物
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- SICE '95. Proceedings of the 34th SICE Annual Conference. International Session Papers
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SICE '95. Proceedings of the 34th SICE Annual Conference. International Session Papers 1449-1452, 2002-11-19
Soc. Instrum. & Control Eng
