Carrier scattering caused by antiparallel coupled magnetic domains in Co/Pd multilayers

説明

Magnetoresistance (MR) characteristics of Co/Pd multilayers were investigated to attain current in-plane (CIP) type of spin valve devices using films with perpendicular magnetic anisotropy. Co/Pd multilayers were prepared by facing targets sputtering apparatus. The background pressure was kept below 5.0 /spl times/ 10/sup -7/ Torr. [Co(0.2 nm)/Pd(0.6 nm)]/sub n/ multilayer were deposited as high coercivity layer at Ar gas pressure P/sub Ar/ of 10 mTorr and [Co(0.6 nm)/Pd(4.6 nm)]/sub n/ multilayer were deposited as low coercivity layer at Ar gas pressure P/sub Ar/ of 5 mTorr. The periodic numbers of Co/Pd bilayers were set at 18 and 6 for [Co(0.2 nm)/Pd(0.6 nm)]/sub n/ and [Co(0.6 nm)/Pd(4.6 nm)]/sub n/ multilayers.

収録刊行物

詳細情報 詳細情報について

問題の指摘

ページトップへ