Reduction of target fault list for crosstalk-induced delay faults by using layout constraints
説明
We propose a method of identifying a set of crosstalk induced delay faults which may need to be tested in synchronous sequential circuits. During the fault list generation 1) we take into account all clocking effects, and 2) infer layout information front the logic level description. With regard to layout constraints we introduce two methods, namely the distance based layout constraint and the cone based layout constraint. The lists of the target faults obtained by the proposed methods are substantially smaller than the sets of all possible combinations of faults.
収録刊行物
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- Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).
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Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). 242-247, 2003-06-26
IEEE Comput. Soc
