A method to find don't care values in test sequences for sequential circuits
説明
We propose a method to find don't care (X) values in a test sequence for a sequential circuit. Given a fully specified test sequence generated by a sequential ATPG, the proposed method produces a test sequence containing Xs without losing stuck-at fault coverage of the original test sequence.
収録刊行物
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- Proceedings 21st International Conference on Computer Design
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Proceedings 21st International Conference on Computer Design 397-399, 2004-05-06
IEEE Comput. Soc