Cross-correlation measurements in searching for a trace of the gate voltage noise in a JFET
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説明
The trace of the gate noise voltage was successfully caught by the measurements of the correlation between the noise outputs of a pair of JFETs connected to a common gate resistor. It is shown for 2SK150 (n-channel junction FET) that the gate noise voltage is 1/f-type and its level is -142dbV 2 /Hz at 1Hz, and that the correlation coefficient between the gate noise voltage and the gate noise current is -1.
収録刊行物
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- SPIE Proceedings
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SPIE Proceedings 5470 529-, 2004-05-25
SPIE