On test generation with a limited number of tests
説明
This paper considers a new test generation scheme in which a limitation of the number of tests exists. Since, in this scheme, correct fault coverage cannot be calculated by the representative faults, we present a method for calculating the correct fault coverage by using the weighted fault list. And then we propose a selection-based test generation method which derives a limited number of tests with higher fault coverage. The experimental results for IDDQ testing shows that our test generation method can generate tests with fault coverage close to the maximum fault coverage.
収録刊行物
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- Proceedings Ninth Great Lakes Symposium on VLSI
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Proceedings Ninth Great Lakes Symposium on VLSI 12-15, 2003-01-20
IEEE Comput. Soc