Magnetic anisotropy and magnetization reversal of (Ga,Mn)As dot-array

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説明

<jats:p>The present article describes the magnetic anisotropy and magnetization reversal of (Ga,Mn)As dot-arrays with 1 μm and 200 nm in diameter fabricated by electron-beam lithography and Ar ion etching. The magnetization reversal mode is due to the magnetization rotation in the dot-arrays fabricated in the present study; they probably have a single-domain structure. The microfabrication of the (Ga,Mn)As dot-arrays modifies magnetic anisotropy through the relaxation of strain in the dots as previously reported; the 200-nm-dot-array exhibits magnetically isotropic features. The cubic anisotropy constant of the 200-nm-dot-array is estimated to be reduced by approximately a tenth of that of the (Ga,Mn)As epitaxial film by the calculation from the measured M-H loops based on a phenomenological model related to magnetic energy.</jats:p>

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詳細情報 詳細情報について

  • CRID
    1871146593084693632
  • DOI
    10.1063/1.3561763
  • ISSN
    10897550
    00218979
  • データソース種別
    • OpenAIRE

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