Development of UHV-LT MFM Operating in Magnetic Field

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We have developed an ultrahigh‐vacuum low‐temperature magnetic force microscope (UHV‐LT MFM) which can operate in magnetic fields. The microscope is based on a non‐contact atomic force microscope using a piezoelectric cantilever. Measurements of hard disc media confirmed spatial resolution of ∼50 nm even at low temperatures down to 10 K. The maximum scanning area is as wide as 2.5 μm × 2.5 μm at 10 K and 7.5 μm × 7.5 μm at room temperature. We have also equipped the microscope with an electromagnet in order to apply external magnetic fields up to 0.25 T in the horizontal direction. The MFM head is mounted on a piezo‐driven rotation stage, so that the direction of magnetic field relative to the sample surface can be set arbitrarily.

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