Stress analysis method considering piezoelectric effects and its application to static strain optic devices
この論文をさがす
説明
A stress analysis method considering piezoelectric effects based on the finite-element method (FEM), which can be applied to arbitrarily anisotropic material-based optical waveguide devices, is newly formulated. To produce a two-step analysis of static strain optic (SSO) and electrooptic (EO) modulations of optical waveguide devices, this stress analysis is linked to the guided mode analysis and the beam propagation analysis taking into account the refractive index changes. Numerical examples are shown for strain-induced optical waveguides and strain-induced polarization mode converters on LiNbO/sub 3/ substrates.
収録刊行物
-
- Journal of Lightwave Technology
-
Journal of Lightwave Technology 17 1626-1633, 1999-01-01
Institute of Electrical and Electronics Engineers (IEEE)