A built-in supply current test circuit for pin opens in assembled PCBs
説明
In this paper, a built-in test circuit of electrical tests is proposed to detect pin opens of CMOS ICs. When a circuit is tested by the test method, current is made to flow through a targeted pin. An open defect is detected by means of the difference between the current of a defect-free circuit and the measured one. Feasibility of tests with the built-in supply current test circuit is examined by Spice simulation. It is shown that a pin open in a CMOS IC can be detected with the test circuit at a speed of 1MHz.
収録刊行物
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- 2014 International Conference on Electronics Packaging (ICEP)
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2014 International Conference on Electronics Packaging (ICEP) 227-230, 2014-04-01
IEEE