Emission microscope studies on FEAs
説明
Electron emission from a FEA was magnified by making use of an emission microscope, and the uniformity of the electron emission was examined. By resolving the electron emission from each microtip, the electron emission stability from a single microtip was successfully measured.
収録刊行物
-
- Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382)
-
Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382) 92-93, 2002-11-27
IEEE