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STRUCTURAL ANALYSIS OF ION IRRADIATED PURE AND AL-DOPED Li4SiO4
Description
The changes of structure with the oxygen ion irradiation were examined for Li4SiO4 and Li3.7Al0.1SiO4 using the Fourier transform infrared photoacoustic spectroscopy and the transmission electron microscope. The new phases were presented to appear with increasing fluence, and they were characterized by the decomposition of Si04-tetrahedra. Such new phase due to the irradiation were not completely recovered at the annealing temperature of 773 K.
