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Nondestructive and Simultaneous Measurement of Complex EM Parameters with Scalar Reflectometer
Description
A scalar reflectometer based, low cost method, named "multi-thickness method" (MTM), is proposed for non destructively and simultaneously characterizing the complex permittivity and permeability of high loss materials via an open-ended coaxial probe. The measurement system is established, while the sample-loaded open-ended coaxial probe is modeled by the spectral domain immitance (SDI) method. A discussion about how to select the multi thicknesses of test sample is also included based on the analysis and our experiences. The broadband frequency-swept measurement has been conducted on a typical absorbing material under different thicknesses combination conditions. The experiment results agree well with the reference data, which validates the feasibility and effectiveness of this improved technique.
Journal
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- 2005 Asia-Pacific Microwave Conference Proceedings
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2005 Asia-Pacific Microwave Conference Proceedings 4 1-4, 2006-03-22
IEEE