Investigation of data transmission characteristicsofpolarisation-controlled 850 nm GaAs-based VCSELsgrown on (311)B substrates

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説明

The data transmission characteristics of polarisation-controlled 850 nm GaAs-based VCSELs grown on (311)B substrates are investigated and compared with those of VCSELs on (100) substrates. Large differences in the dependence of the BER on bias current and the power penalty between polarisation resolved and unresolved systems are observed in VCSELs on (311)B and (100) substrates. The beneficial effect of the polarisation stability of VCSELs on (311)B substrates is clearly demonstrated.

収録刊行物

  • Electronics Letters

    Electronics Letters 35 45-46, 1999-01-07

    Institution of Engineering and Technology (IET)

詳細情報 詳細情報について

  • CRID
    1871991018051055872
  • DOI
    10.1049/el:19990034
  • ISSN
    1350911X
    00135194
  • データソース種別
    • OpenAIRE

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