Near-field characterization of micro-aperture surface emitting laser for near field data storage
説明
Summary form only given. We have fabricated a 400 nm square micro-aperture VCSEL with single transverse mode operation. We carried out the near field characterization using a sharpened fiber probe. The FWHM of intensity below threshold was 250 nm, and our metal micro-aperture VCSEL may have a potential for a high resolution optical head.
収録刊行物
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- LEOS 2000. 2000 IEEE Annual Meeting Conference Proceedings. 13th Annual Meeting. IEEE Lasers and Electro-Optics Society 2000 Annual Meeting (Cat. No.00CH37080)
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LEOS 2000. 2000 IEEE Annual Meeting Conference Proceedings. 13th Annual Meeting. IEEE Lasers and Electro-Optics Society 2000 Annual Meeting (Cat. No.00CH37080) 2 896-, 2002-11-08
IEEE