Attempt of quantitative analysis of morphological synaptic connectivity by combining focused ion beam milling and scanning electron microscopy (FIB–SEM) and confocal laser-scanning microscope

詳細情報 詳細情報について

• CRID

  1872272492767988864

• DOI

  10.1016/j.neures.2011.07.1351

• ISSN

  01680102

• データソース種別

  • OpenAIRE