Diffraction Patterns Obtained by Scanning Electron Microscope

DOI Open Access

Search this article

Description

<jats:title>Abstract</jats:title> <jats:p>Kossel-Möllenstedt and Kikuchi patterns are obtained by transmission scanning electron microscopy and compared with those obtained by the convergent beam technique from the same portion of the specimen. The identity of corresponding patterns obtained by both techniques shows the validity of the reciprocal theorem in electron diffraction for both elastic and inelastic scattering. The variations of Kossel-Möllenstedt patterns with the conditions of the incident beam and the position of the detector are also shown.</jats:p>

Journal

Details 詳細情報について

Report a problem

Back to top